Reliability Wearout Mechanisms in Advanced CMOS Technologies

£169.00
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Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

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Reliability Wearout Mechanisms in Advanced CMOS Technologies

£169.00

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FREE Shipping

14-Day Returns Policy

Sold by:

£169.00

In stock
FREE Shipping

14-Day Returns Policy

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Description

Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology it assumes no reliability education or experience.
  • Brand: John Wiley & Sons Inc
  • Category: Computing & Internet
  • Format: Hardback
  • Language: English
  • Publication Date: 2023-03-22
  • Publisher / Label: John Wiley & Sons Inc
  • Author: Alvin W. Strong (IBM)
  • Number of Pages: 640
  • Fruugo ID: 434363568-911570901
  • ISBN: 9780471731726

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