Comprehensive MEP 1 SIM + eSIM Integration This WYLIE US version repair tool features a built-in MEP 1 SIM and eSIM integrated solution designed specifically for iPhone 17 Pro Max logic board work. It enables stable signal simulation and verification, making it ideal for SIM activation, network testing, and board-level diagnostics. Optimized for iPhone 17 Pro Max Repair Engineered for precision, this tool supports professional maintenance scenarios such as baseband circuit inspection, SIM card track troubleshooting, and system unlocking operations on the iPhone 17 Pro Max. It improves efficiency and accuracy for both independent repair technicians and service centers. Supports SIMHUB IC for Advanced Debugging Fully compatible with SIMHUB IC, this solution helps technicians quickly locate, identify, and analyze SIM-related faults. It provides reliable communication between the logic board and SIM/eSIM module, ensuring more consistent test results during complex repair workflows. Ideal for Board-Level Training and Teaching This integrated SIM + eSIM solution is also an effective teaching aid for training institutions and repair schools. It allows students to practice diagnosing SIM path issues, eSIM communication, and SIMHUB IC behavior on iPhone 17 Pro Max logic boards in a controlled environment. Color: As Shown Material: FPC Package Contents: 1*Chip 2*Cable Only the above package content, other products are not included. Note: Light reflection and different displays may cause the color of the item in the picture a little different from the real thing. The measurement allowed error is +/- 1-3cm.